Compatibility Verification Test Tools 

NameUsagePhoto
Test PCD assembly
  • Tests the functionality of a card by applying a certain amount of magnetic field to the card and measuring its response.
  • Consists of a test PCD antenna, a sense coil, and an adjustment circuit.
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Reference PICCReference PICC
  • An instrument that simulates the electric circuit of a proximity IC card.
  • Used for measuring the generated magnetic field of a proximity coupling device, as well as its power transmission performance and response reception performance.
  • Reference PICC as stipulated in the ISO/IEC10373-6 standard.
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Reference PICC-S
  • Used for measuring the generated magnetic field of a proximity coupling device, as well as its power transmission performance and response reception performance.
  • Used for tests designed for cards those have a small coil.
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Reference PICC-L
  • Used for measuring the generated magnetic field of a proximity coupling device, as well as its power transmission performance and response reception performance.
  • Used for tests designed for cards those have a large coil.
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Calibration coilCalibration coil
  • Used for measuring the maximum and minimum operating magnetic fields of a card and the generated magnetic field of a proximity coupling device.
  • Calibration coil as stipulated in the ISO/IEC10373-6 standard.
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Calibration coil-S
  • Used for measuring the maximum and minimum operating magnetic fields of a card and the generated magnetic field of a proximity coupling device.
  • Used for tests designed for cards those have a small coil.
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Calibration coil-L
  • Used for measuring the maximum and minimum operating magnetic fields of a card and the generated magnetic field of a proximity coupling device.
  • Used for tests designed for cards those have a large coil.
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Test PCD-S*1
  • Used to test the functionality of a card by applying a certain amount of magnetic field to the card and measuring its response.
  • Test performed using a test PCD antenna with a small coil
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Test PCD adjustment circuit
  • Adjustment circuit used for impedance matching of test PCD.
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*1: Used only for card evaluation (Others are used for evaluating both card and proximity coupling devices).
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